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dc.contributor.authorIslam, Md Kafiul
dc.contributor.authorRastegarnia, Amir
dc.contributor.authorYang, Zhi
dc.date.accessioned2016-10-26T14:49:55Z
dc.date.available2016-10-26T14:49:55Z
dc.date.issued2016-10-15
dc.identifier.issn0987-7053
dc.identifier.urihttp://dir.iub.edu.bd:8180/handle/123456789/277
dc.descriptionIt's a Review Article.en_US
dc.description.abstractElectroencephalography (EEG) is the most popular brain activity recording technique used in wide range of applications. One of the commonly faced problems in EEG recordings is the presence of artifacts that come from sources other than brain and contaminate the acquired signals significantly. Therefore, much research over the past 15 years has focused on identifying ways for handling such artifacts in the preprocessing stage. However, this is still an active area of research as no single existing artifact detection/removal method is complete or universal. This article presents an extensive review of the existing state-of-the-art artifact detection and removal methods from scalp EEG for all potential EEG-based applications and analyses the pros and cons of each method. First, a general overview of the different artifact types that are found in scalp EEG and their effect on particular applications are presented. In addition, the methods are compared based on their ability to remove certain types of artifacts and their suitability in relevant applications (only functional comparison is provided not performance evaluation of methods). Finally, the future direction and expected challenges of current research is discussed. Therefore, this review is expected to be helpful for interested researchers who will develop and/or apply artifact handling algorithm/technique in future for their applications as well as for those willing to improve the existing algorithms or propose a new solution in this particular area of research.en_US
dc.description.sponsorshipA*STAR PSF Grant R-263-000-699-305 and NUS YIA Grant R-263-000-A29-133en_US
dc.language.isoen_USen_US
dc.publisherElsevieren_US
dc.subjectAmbulatory EEGen_US
dc.subjectArtifact removalen_US
dc.subjectBrain-computer interface (BCI)en_US
dc.subjectEmpirical mode decomposition (EMD)en_US
dc.subjectIndependent component analysis (ICA)en_US
dc.subjectScalp EEGen_US
dc.subjectWavelet transformen_US
dc.titleMethods for Artifact Detection and Removal from Scalp EEG: A Reviewen_US
dc.typeArticleen_US


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